S. Oh, Z. Huang, Y.Shi, D. Kuzum, IEEE Electron Device Letters, 2019.
2. The Impact of Resistance Drift of PCM Synaptic Devices on Artificial Neural Network Performance,Y. Shi, Z. Huang, S. Oh, N. Kaslan, J. Song, D. Kuzum, IEEE Transactions on Electron Devices, 2019.
Successfully propose a cast & crew for next highest-grossing film. Please see attached slide for more information.
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